Diffusion in thin films

Brown, Laurence C (1961) Diffusion in thin films. PhD thesis, University of Glasgow.

Abstract

Diffusion coefficients and activation energies for diffusion in several successively evaporated two layer metal films have been determined by measurements of the reflectivity changes at the metal surfaces on annealing. The reflectivity changes were due to the motion of phase boundaries and it proved possible to identify the phases formed. Results indicated a vacancy diffusion mechanism rather than grain boundary diffusion and satisfactory agreement was obtained with results for the faster direction of diffusion in bulk specimens. A mechanism for the motion of the atoms was postulated in terms of a vacancy flow.

• Item Type: Thesis (PhD)
• Qualification Level: Doctoral
• Additional Information: Adviser: C Weaver
• Keywords: Materials science
• Date of Award: 1961
• Depositing User: Enlighten Team
• Unique ID: glathesis:1961-72337
• Copyright: Copyright of this thesis is held by the author.
• Date Deposited: 24 May 2019 15:12
• Last Modified: 24 May 2019 15:12
• URI: https://theses.gla.ac.uk/id/eprint/72337