Studies of pi-Bonding by X-Ray Crystal Structure Analysis

McDonald, W. S (1965) Studies of pi-Bonding by X-Ray Crystal Structure Analysis. PhD thesis, University of Glasgow.

Abstract

X-ray crystal structure analyses and refinements are described of six compounds having structures in which a second-row element (aluminium, silicon, phosphorus, or sulphur) is bonded to four atoms of a first-row element (nitrogen or oxygen). The dimensions of molecules and ions of this type provide information leading to an improved understanding of the pi-bonding in compounds of the second-row elements. Least-squares refinement was used in each case to obtain atomic co-ordinates and molecular dimensions, together with the estimated standard deviations of these quantities.

• Item Type: Thesis (PhD)
• Qualification Level: Doctoral
• Keywords: Physical chemistry, Inorganic chemistry, Molecular chemistry
• Date of Award: 1965
• Depositing User: Enlighten Team
• Unique ID: glathesis:1965-77135
• Copyright: Copyright of this thesis is held by the author.
• Date Deposited: 14 Jan 2020 09:19
• Last Modified: 14 Jan 2020 09:19
• URI: https://theses.gla.ac.uk/id/eprint/77135