McDonald, W. S
(1965)
Studies of pi-Bonding by X-Ray Crystal Structure Analysis.
PhD thesis, University of Glasgow.
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Abstract
X-ray crystal structure analyses and refinements are described of six compounds having structures in which a second-row element (aluminium, silicon, phosphorus, or sulphur) is bonded to four atoms of a first-row element (nitrogen or oxygen). The dimensions of molecules and ions of this type provide information leading to an improved understanding of the pi-bonding in compounds of the second-row elements. Least-squares refinement was used in each case to obtain atomic co-ordinates and molecular dimensions, together with the estimated standard deviations of these quantities.
| Item Type: |
Thesis
(PhD)
|
| Qualification Level: |
Doctoral |
| Keywords: |
Physical chemistry, Inorganic chemistry, Molecular chemistry |
| Date of Award: |
1965 |
| Depositing User: |
Enlighten Team
|
| Unique ID: |
glathesis:1965-77135 |
| Copyright: |
Copyright of this thesis is held by the author. |
| Date Deposited: |
14 Jan 2020 09:19 |
| Last Modified: |
14 Jan 2020 09:19 |
| URI: |
http://theses.gla.ac.uk/id/eprint/77135 |
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