Characterisation of focused ion beam nanostructures by transmission electron microscopy

Turnbull, Susan B. (2009) Characterisation of focused ion beam nanostructures by transmission electron microscopy. PhD thesis, University of Glasgow.

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Abstract

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omain walls (DW). Lines were written by FIB in simple elements with dimensions <
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-uniform magnetisation or multi-domain structures separated by DW with spacing <
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Item Type: Thesis (PhD)
Qualification Level: Doctoral
Keywords: magnetic thin films, focused ion beam, ion irradiation, transmission electron microscopy, magnetic nanostructures, domain wall traps
Subjects: Q Science > QC Physics
Colleges/Schools: College of Science and Engineering > School of Physics and Astronomy
Supervisor's Name: McVitie, Dr. Stephen
Date of Award: 2009
Depositing User: Miss S B Turnbull
Unique ID: glathesis:2009-572
Copyright: Copyright of this thesis is held by the author.
Date Deposited: 07 Apr 2009
Last Modified: 10 Dec 2012 13:19
URI: http://theses.gla.ac.uk/id/eprint/572

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